A non-destructive method for measuring the mechanical properties of ultrathin films prepared by atomic layer deposition

Title
A non-destructive method for measuring the mechanical properties of ultrathin films prepared by atomic layer deposition
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 105, Issue 6, Pages 061901
Publisher
AIP Publishing
Online
2014-08-12
DOI
10.1063/1.4892539

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