Polarization induced resistance switching effect in ferroelectric vinylidene-fluoride/trifluoroethylene copolymer ultrathin films

Ferroelectric tunnel junctions for information storage and processing

(2014) Vincent Garcia et al.   Nature Communications

Giant Electroresistance of Super-tetragonal BiFeO3-Based Ferroelectric Tunnel Junctions

(2013) Hiroyuki Yamada et al.   ACS Nano

Investigation on Thickness Effect of Ultrathin Vinylidene Fluoride/Trifluoroethylene Copolymer Films

(2013) Yuichiro Mabuchi et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Polarization Switching Dynamics of Vinylidene Fluoride/Trifluoroethylene Copolymer Thin Films under High Electric Field at Various Temperatures

(2013) Hajime Ishii et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Review of Emerging New Solid-State Non-Volatile Memories

(2013) Yoshihisa Fujisaki   JAPANESE JOURNAL OF APPLIED PHYSICS

Ferroelectric-field-effect-enhanced electroresistance in metal/ferroelectric/semiconductor tunnel junctions

(2013) Zheng Wen et al.   NATURE MATERIALS

Ferroelectric Tunnel Junction Memory Devices made from Monolayers of Vinylidene Fluoride Oligomers

(2012) Damar Yoga Kusuma et al.   ADVANCED MATERIALS

Mechanically-Induced Resistive Switching in Ferroelectric Tunnel Junctions

(2012) H. Lu et al.   NANO LETTERS

Room-Temperature Ferroelectric Resistive Switching in Ultrathin Pb(Zr0.2Ti0.8)O3 Films

(2011) Daniel Pantel et al.   ACS Nano

Ultrafast Polarization Switching in Ferroelectric Polymer Thin Films at Extremely High Electric Fields

(2011) Hajime Ishii et al.   Applied Physics Express

Solid-state memories based on ferroelectric tunnel junctions

(2011) André Chanthbouala et al.   Nature Nanotechnology

Giant tunnel electroresistance with PbTiO3 ferroelectric tunnel barriers

(2010) A. Crassous et al.   APPLIED PHYSICS LETTERS

Electroresistance effects in ferroelectric tunnel barriers

(2010) D. Pantel et al.   PHYSICAL REVIEW B

Tunneling Electroresistance Effect in Ferroelectric Tunnel Junctions at the Nanoscale

(2009) A. Gruverman et al.   NANO LETTERS