Gate assisted Kelvin test structure to measure the electron and hole flows at the same nanowire contacts

Contact transport of focused ion beam-deposited Pt to Si nanowires: From measurement to understanding

(2012) J. J. Ke et al.   APPLIED PHYSICS LETTERS

Length scaling of carbon nanotube transistors

(2010) Aaron D. Franklin et al.   Nature Nanotechnology

Nanowire transistors without junctions

(2010) Jean-Pierre Colinge et al.   Nature Nanotechnology

Extracting Mobility Degradation and Total Series Resistance of Cylindrical Gate-All-Around Silicon Nanowire Field-Effect Transistors

(2009) Luryi Choi et al.   IEEE ELECTRON DEVICE LETTERS

Metrology for the Electrical Characterization of Semiconductor Nanowires

(2008) Curt A. Richter et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Toward Nanowire Electronics

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