Extracting the anisotropic optical parameters of chiral plasmonic nanostructured thin films using generalized ellipsometry

Title
Extracting the anisotropic optical parameters of chiral plasmonic nanostructured thin films using generalized ellipsometry
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 105, Issue 7, Pages 071109
Publisher
AIP Publishing
Online
2014-08-22
DOI
10.1063/1.4893785

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