Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry
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Title
Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 10, Pages 103114
Publisher
AIP Publishing
Online
2014-03-15
DOI
10.1063/1.4868108
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