Journal
APPLIED PHYSICS LETTERS
Volume 103, Issue 18, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4827812
Keywords
-
Categories
Funding
- Chinese National Key Basic Research Special Fund [2011CB922003]
- Natural Science Foundation of China [11174159, 11374164]
- Natural Science Foundation of Tianjin [13JCYBJC16300]
Ask authors/readers for more resources
Based on the polarization-sensitive absorption effect, we have proposed a method to accurately count the number of carbon atomic layers for both exfoliated and chemical vapor deposition graphene sheets on transparent substrate. With spatial scanning, the three-dimensional imaging of graphene sample can be achieved to test the uniformity of the sample. In addition, our method serves for graphene test on transparent substrate, which is different from the commonly used SiO2/Si substrate. Moreover, this method is also applicable to layers counting of other two-dimensional materials. Therefore, it paves the way for applications of two-dimensional materials on transparent medium. (c) 2013 AIP Publishing LLC.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available