Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion
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Title
Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 103, Issue 5, Pages 052604
Publisher
AIP Publishing
Online
2013-07-30
DOI
10.1063/1.4816428
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