In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO3 thin films

Published 2013 View Full Article

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Title
In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO3 thin films
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 103, Issue 24, Pages 242904
Publisher
AIP Publishing
Online
2013-12-12
DOI
10.1063/1.4848779
References
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