Direct measurement of band offset at the interface between CdS and Cu2ZnSnS4 using hard X-ray photoelectron spectroscopy

Title
Direct measurement of band offset at the interface between CdS and Cu2ZnSnS4 using hard X-ray photoelectron spectroscopy
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 103, Issue 24, Pages 243906
Publisher
AIP Publishing
Online
2013-12-14
DOI
10.1063/1.4850235

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