Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals

Title
Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 103, Issue 6, Pages 062102
Publisher
AIP Publishing
Online
2013-08-06
DOI
10.1063/1.4817824

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