Top oxide thickness dependence of remote phonon and charged impurity scattering in top-gated graphene
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Title
Top oxide thickness dependence of remote phonon and charged impurity scattering in top-gated graphene
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 18, Pages 183506
Publisher
AIP Publishing
Online
2013-05-09
DOI
10.1063/1.4804432
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