Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units

Title
Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 21, Pages 213301
Publisher
AIP Publishing
Online
2013-05-31
DOI
10.1063/1.4808026

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