Characterization and suppression of low-frequency noise in Si/SiGe quantum point contacts and quantum dots

Title
Characterization and suppression of low-frequency noise in Si/SiGe quantum point contacts and quantum dots
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 12, Pages 123113
Publisher
AIP Publishing
Online
2013-03-30
DOI
10.1063/1.4799287

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