4.6 Article

Local carrier dynamics around the sub-surface basal-plane stacking faults of GaN studied by spatio-time-resolved cathodoluminescence using a front-excitation-type photoelectron-gun

Journal

APPLIED PHYSICS LETTERS
Volume 103, Issue 5, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4817297

Keywords

-

Funding

  1. NEDO programs by METI
  2. MEXT [23656206, 24760250]
  3. The Asahi Glass Foundation, Japan
  4. AOARD/AFOSR
  5. Grants-in-Aid for Scientific Research [24760250, 22246037, 23656206] Funding Source: KAKEN

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Local carrier dynamics around the sub-surface basal-plane stacking faults (BSFs) accidentally formed in a low dislocation density c-plane GaN were studied by the spatio-time-resolved cathodoluminescence measurement. A high photoelectron (PE) emission efficiency of the front-excitation-type PE-gun enabled to investigate sub-surface defect structures with low acceleration voltages. As a result, the presence of an energy transfer channel of excitons from neutral donor bound states to I-1-type BSF bound states was confirmed. Careful comparisons of cathodoluminescence intensity mapping images taken at 3.305 eV and those corresponding to I-1-BSFs indicated the presence of prismatic-plane stacking faults connecting the BSFs into a bundle. (C) 2013 AIP Publishing LLC.

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