Morphological, structural, and emission characterization of trench defects in InGaN/GaN quantum well structures

Published 2012 View Full Article

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Title
Morphological, structural, and emission characterization of trench defects in InGaN/GaN quantum well structures
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 101, Issue 21, Pages 212107
Publisher
AIP Publishing
Online
2012-11-22
DOI
10.1063/1.4768291
References
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