Intrinsic ultrathin topological insulators grown via molecular beam epitaxy characterized by in-situ angle resolved photoemission spectroscopy
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Title
Intrinsic ultrathin topological insulators grown via molecular beam epitaxy characterized by in-situ angle resolved photoemission spectroscopy
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 101, Issue 1, Pages 013118
Publisher
AIP Publishing
Online
2012-07-07
DOI
10.1063/1.4733317
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