Journal
APPLIED PHYSICS LETTERS
Volume 100, Issue 6, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3684274
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- Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy
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An approach for surface potential imaging based on half-harmonic band excitation (BE) in Kelvin probe force microscopy is demonstrated. Using linear and half-harmonic BE enables quantitative correction of the cantilever transfer function. Half-harmonic band excitation Kelvin probe force microscopy (HBE KPFM) thus allows quantitative separation of surface potential and topographic contributions to the signal, obviating the primary sources of topographic cross-talk. HBE KPFM imaging and voltage spectroscopy methods are illustrated for several model systems. (C) 2012 American Institute of Physics. [doi:10.1063/1.3684274]
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