Evaluating the electrical properties of silicon wafer solar cells using hyperspectral imaging of luminescence

Polarization analysis of luminescence for the characterization of silicon wafer solar cells

(2011) Matthew P. Peloso et al.   APPLIED PHYSICS LETTERS

Spectral and spatially resolved imaging of photoluminescence in multicrystalline silicon wafers

(2011) E. Olsen et al.   APPLIED PHYSICS LETTERS

Bulk minority carrier lifetimes and doping of silicon bricks from photoluminescence intensity ratios

(2011) Bernhard Mitchell et al.   JOURNAL OF APPLIED PHYSICS

Minority carrier lifetime in silicon wafers from quasi-steady-state photoluminescence

(2010) J. A. Giesecke et al.   APPLIED PHYSICS LETTERS

Detection of physical defects in solar cells by hyperspectral imaging technology

(2010) Qingli Li et al.   OPTICS AND LASER TECHNOLOGY

Reciprocity between electroluminescence and quantum efficiency used for the characterization of silicon solar cells

(2009) Thomas Kirchartz et al.   PROGRESS IN PHOTOVOLTAICS