Journal
APPLIED PHYSICS LETTERS
Volume 98, Issue 7, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3556615
Keywords
-
Categories
Funding
- DARPA [HR0011-09-C-0114]
- Nanoelectronics Research Initiative (NRI) through the Western Institute of Nanoelectronics (WIN)
Ask authors/readers for more resources
We use ultrafast current-induced switching measurements to study spin-transfer switching performance metrics, such as write energy per bit (E(W)) and switching current density (J(c)), as a function of resistance-area product (RA) (hence MgO thickness) in magnetic tunnel junction cells used for magnetoresistive random access memory (MRAM). E(W) increases with RA, while J(c) decreases with increasing RA for both switching directions. The results are discussed in terms of RA optimization for low write energy and current drive capability (hence density) of the MRAM cells. Switching times < 2 ns and write energies < 0.3 pJ are demonstrated for 135 nm x 65 nm CoFeB/MgO/CoFeB devices. (C) 2011 American Institute of Physics. [doi:10.1063/1.3556615]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available