Journal
APPLIED PHYSICS LETTERS
Volume 99, Issue 17, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3656001
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- SRC FCRP MARCO Materials Structures
- National Science Foundation [0925844]
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The interface trap density (D-it) and bonding of the HfO2/InP interface is investigated. The energy distribution of interface states extracted using capacitance-voltage measurements show a peak near midgap in InP and a tail, which extends into the InP conduction band. Both the D-it peak and the conduction band D-it increase with increasing post-deposition annealing temperature. A substantial increase in the native oxides with annealing temperature is observed with x-ray photoelectron spectroscopy. The possible bonding states responsible for the defects are presented. (C) 2011 American Institute of Physics. [doi:10.1063/1.3656001]
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