Comparing retention and recombination of electrically injected carriers in Si quantum dots embedded in Si-rich SiNx films

Published 2011 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Comparing retention and recombination of electrically injected carriers in Si quantum dots embedded in Si-rich SiNx films
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 99, Issue 24, Pages 243501
Publisher
AIP Publishing
Online
2011-12-13
DOI
10.1063/1.3663530
References
View 2 related references

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.