4.6 Article

Reduction in surface recombination and enhancement of light emission in silicon photonic crystals treated by high-pressure water-vapor annealing

Journal

APPLIED PHYSICS LETTERS
Volume 97, Issue 12, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3489419

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Funding

  1. Japan Science and Technology Agency
  2. Centers of Excellence
  3. Ministry of Education, Culture, Sports, Science and Technology of Japan
  4. Ozawa and Yoshikawa Memorial Electronics Research Foundation
  5. Grants-in-Aid for Scientific Research [21241037] Funding Source: KAKEN

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We propose and demonstrate the application of high-pressure water-vapor annealing (HWA) to silicon photonic crystals for surface passivation. We find that the photoluminescence intensity from a sample treated with HWA is enhanced by a factor of similar to 6. We confirm that this enhancement originates from a reduction in the surface-recombination velocity (SRV) by a factor of similar to 0.4. The estimated SRV is as low as 2.1x10(3) cm/s at room temperature. These results indicate that HWA is a promising approach for efficient surface passivation in silicon photonic nanostructures. (C) 2010 American Institute of Physics. [doi:10.1063/1.3489419]

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