Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 4, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3472204
Keywords
carrier density; diamond; diffusion; electrical conductivity; electrical resistivity; elemental semiconductors; lithium; nitrogen; semiconductor doping; semiconductor thin films
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Funding
- National Science Council, Republic of China [NSC99-2119-M-032-003-MY2]
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We report monolithic n-type conductivity on low-temperature (< 570 degrees C) grown ultrananocrystalline diamond (UNCD) films by Li-diffusion (about 255 nm) from LiNbO(3) substrates. Low resistivity of 1.2 Omega cm with carrier concentration of -2 x 10(20) cm(-3) is obtained on freestanding UNCD films. The films bonded to Cu-tape show very low turn-on field of 4.2 V/mu m with emission current density of above 0.3 mA/cm(2) at a low applied filed of 10 V/mu m. The n-type conductivity of low-temperature Li-diffused UNCD films overwhelms that of the high-temperature (>= 800 degrees C) nitrogen doped ones and will make a significant impact to diamond-based electronics. (C) 2010 American Institute of Physics. [doi:10.1063/1.3472204]
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