Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 14, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3485673
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Funding
- European Commission [EXT-0023899-NanoHeaters, EXC-006680-UltraNanoMan, IP-026467-ManuDirect, 20070874, 20080434, 20090387, RII3-CT-2004-506008]
- Cyprus Research Promotion Foundation-NanoCyprus
- Paul Scherrer Institute
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The observation of rapid reactions in nanoscale multilayers present challenges that require sophisticated analysis methods. We present high-resolution in situ x-ray diffraction analysis of reactions in nanoscale foils of Ni0.9V0.1-Al using the Mythen II solid-state microstrip detector system at the Material Science beamline of the Swiss Light Source Synchrotron at Paul Scherrer Institute in Villigen, Switzerland. The results reveal the temperature evolution corresponding to the rapid formation of NiAl intermetallic phase, vanadium segregation and formation of stresses during cooling, determined at high temporal (0.125 ms) and angular (0.004 degrees) resolution over a full angular range of 120 degrees. (C) 2010 American Institute of Physics. [doi:10.1063/1.3485673]
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