Electrical characterization of organic resistive memory with interfacial oxide layers formed by O2 plasma treatment

Title
Electrical characterization of organic resistive memory with interfacial oxide layers formed by O2 plasma treatment
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 6, Pages 063305
Publisher
AIP Publishing
Online
2010-08-14
DOI
10.1063/1.3478840

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