Wide-band capacitance measurement on a semiconductor double quantum dot for studying tunneling dynamics

Published 2010 View Full Article

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Title
Wide-band capacitance measurement on a semiconductor double quantum dot for studying tunneling dynamics
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 96, Issue 3, Pages 032104
Publisher
AIP Publishing
Online
2010-01-20
DOI
10.1063/1.3285180
References
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