Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 19, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3515901
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Funding
- Laboratory Directed Research and Development Program at Sandia National Laboratories
- U.S. Department of Energy [DE-AC04-94AL85000]
- U.S. Department of Energy's Office of Electricity Delivery and Energy Reliability
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The role of crystal coherence length on the infrared optical response of MgO thin films was investigated with regard to Reststrahlen band photon-phonon coupling. Preferentially (001)-oriented sputtered and evaporated ion-beam assisted deposited thin films were prepared on silicon and annealed to vary film microstructure. Film crystalline coherence was characterized by x-ray diffraction line broadening and transmission electron microscopy. The infrared dielectric response revealed a strong dependence of dielectric resonance magnitude on crystalline coherence. Shifts to lower transverse optical phonon frequencies were observed with increased crystalline coherence. Increased optical phonon damping is attributed to increasing granularity and intergrain misorientation. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3515901]
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