4.6 Article

Plasma characterization using terahertz-wave-enhanced fluorescence

Journal

APPLIED PHYSICS LETTERS
Volume 96, Issue 4, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3291676

Keywords

electron impact excitation; electron impact ionisation; electron relaxation time; fluorescence; nitrogen; plasma collision processes; plasma density; plasma production by laser; terahertz waves

Funding

  1. National Science Foundation
  2. Defense Threat Reduction Agency
  3. Department of Homeland Security through the DHS-ALERT Center [2008-ST-061-ED0001]
  4. Directorate For Engineering
  5. Div Of Electrical, Commun & Cyber Sys [0852728, 0923353] Funding Source: National Science Foundation

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We demonstrate that the terahertz-wave-enhanced fluorescence emission from excited atoms or molecules can be employed in the characterization of laser-induced gas plasmas. The electron relaxation time and plasma density were deduced through applying the electron impact excitation/ionization and electron-ion recombination processes to the measured time-dependent enhanced fluorescence. The electron collision dynamics of nitrogen plasma excited at different gas pressures and laser pulse energies have been systematically investigated. This plasma characterization method provides picosecond temporal resolution and enables omnidirectional optical signal collection.

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