Ionized-oxygen vacancies related dielectric relaxation in heteroepitaxial K0.5Na0.5NbO3/La0.67Sr0.33MnO3 structure at elevated temperature

Authors

Keywords

Journal

Volume 95, Issue 13, Pages 132905

Publisher

AIP Publishing

Online

2009-10-03

DOI

10.1063/1.3242009

References

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