Measurement of electron overflow in 450 nm InGaN light-emitting diode structures

Title
Measurement of electron overflow in 450 nm InGaN light-emitting diode structures
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 94, Issue 6, Pages 061116
Publisher
AIP Publishing
Online
2009-02-13
DOI
10.1063/1.3081059

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