Study of hole accumulation in individual germanium quantum dots in p-type silicon by off-axis electron holography

Published 2009 View Full Article

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Title
Study of hole accumulation in individual germanium quantum dots in p-type silicon by off-axis electron holography
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 94, Issue 23, Pages 232108
Publisher
AIP Publishing
Online
2009-06-13
DOI
10.1063/1.3154524
References
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