X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset

Authors

Keywords

Journal

Volume 94, Issue 2, Pages 022108

Publisher

AIP Publishing

Online

2009-01-15

DOI

10.1063/1.3072367

References

View 4 related references

Discuss science. Find collaborators. Network.

Join a conversation

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now