4.6 Article

Field and polarity dependence of time-to-resistance increase in Fe-O films studied by constant voltage stress method

Journal

APPLIED PHYSICS LETTERS
Volume 94, Issue 1, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3064127

Keywords

electrical conductivity; iron compounds; sputter deposition; switching; thermomechanical treatment; thin films

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Constant voltage stress (CVS) was applied to Fe-O films prepared by a sputtering process to investigate a stress-induced resistance increase leading to a fundamental mechanism for switching behaviors. Under the CVS, an abrupt resistance increase was found for both stress polarities. A conduction mechanism after the resistance increase exhibited non-Ohmic transport. The time-to-resistance increase (t(r)) under the CVS was revealed to strongly depend on stress voltage as well as the polarity. From a polarity-dependent resistance increase determined by a time-zero measurement, the voltage and polarity-dependent t(r) were discussed on the basis of field- and structure-enhanced thermochemical reaction mechanisms.

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