Energy-band alignment of HfO2∕SiO2∕SiC gate dielectric stack

Title
Energy-band alignment of HfO2∕SiO2∕SiC gate dielectric stack
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 4, Pages 042904
Publisher
AIP Publishing
Online
2008-01-31
DOI
10.1063/1.2839314

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