Investigation of trap effects in AlGaN∕GaN field-effect transistors by temperature dependent threshold voltage analysis

Title
Investigation of trap effects in AlGaN∕GaN field-effect transistors by temperature dependent threshold voltage analysis
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 15, Pages 152113
Publisher
AIP Publishing
Online
2008-04-18
DOI
10.1063/1.2911727

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