Influence of fine roughness of insulator surface on threshold voltage stability of organic field-effect transistors

Published 2008 View Full Article

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Title
Influence of fine roughness of insulator surface on threshold voltage stability of organic field-effect transistors
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 3, Pages 033308
Publisher
AIP Publishing
Online
2008-07-23
DOI
10.1063/1.2957987
References
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