Experimental characterization of single-walled carbon nanotube film-Si Schottky contacts using metal-semiconductor-metal structures

Title
Experimental characterization of single-walled carbon nanotube film-Si Schottky contacts using metal-semiconductor-metal structures
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 24, Pages 243116
Publisher
AIP Publishing
Online
2008-06-19
DOI
10.1063/1.2945644

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