Single-Atomic-Level Probe of Transient Carrier Dynamics by Laser-Combined Scanning Tunneling Microscopy

Title
Single-Atomic-Level Probe of Transient Carrier Dynamics by Laser-Combined Scanning Tunneling Microscopy
Authors
Keywords
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Journal
Applied Physics Express
Volume 6, Issue 3, Pages 032401
Publisher
Japan Society of Applied Physics
Online
2013-03-16
DOI
10.7567/apex.6.032401

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