4.8 Article

Redox-Active Molecular Nanowire Flash Memory for High-Endurance and High-Density Nonvolatile Memory Applications

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 7, Issue 49, Pages 27306-27313

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.5b08517

Keywords

redox-active molecules; Si nanowire FETs; flash memory; endurance; multi-bit memory

Funding

  1. NSF [ECCS-1127093, CHE-1362214]
  2. Virginia MicroElectronics Consortium research grant
  3. AOARD [FA2386-14-1-4072]
  4. Direct For Mathematical & Physical Scien
  5. Division Of Chemistry [1362214] Funding Source: National Science Foundation

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In this work, high-performance top-gated nanowire molecular flash memory has been fabricated with redox-active molecules. Different molecules with one and two redox centers have been tested. The flash memory has clean solid/molecule and dielectric interfaces, due to the pristine molecular self-assembly and the nanowire device self-alignment fabrication process. The memory cells exhibit discrete charged states at small gate voltages. Such multi-bit memory in one cell is favorable for high-density storage. These memory devices exhibit fast speed, low power, long memory retention, and exceptionally good endurance (>10(9) cycles). The excellent characteristics are derived from the intrinsic charge-storage properties of the protected redox-active molecules. Such multi-bit molecular flash memory is very attractive for high-endurance and high-density on-chip memory applications in future portable electronics.

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