Introgression of a 4D chromosomal fragment into durum wheat confers aluminium tolerance

Title
Introgression of a 4D chromosomal fragment into durum wheat confers aluminium tolerance
Authors
Keywords
-
Journal
ANNALS OF BOTANY
Volume 114, Issue 1, Pages 135-144
Publisher
Oxford University Press (OUP)
Online
2014-04-16
DOI
10.1093/aob/mcu070

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