Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

Title
Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time
Authors
Keywords
-
Journal
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION
Volume 52, Issue 40, Pages 10541-10544
Publisher
Wiley
Online
2013-08-17
DOI
10.1002/anie.201302532

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