Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards

DESIGN AND PERFORMANCE OF TWO ORTHOGONAL EXTRACTION TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETERS FOR FOCUSED ION BEAM INSTRUMENTS

(2014) Deborah Alberts et al.   INSTRUMENTATION SCIENCE & TECHNOLOGY

Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles

(2014) Vasile-Dan Hodoroaba et al.   MICROSCOPY AND MICROANALYSIS

A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides

(2013) Gerald Holzlechner et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Scanning Auger microscopy for high lateral and depth elemental sensitivity

(2013) E. Martinez et al.   JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Ion beam lithography for Fresnel zone plates in X-ray microscopy

(2013) Kahraman Keskinbora et al.   OPTICS EXPRESS

Summary of ISO/TC 201 Technical Report: ISO/TR 19319:2013 - Surface chemical analysis - Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods

(2013) M. Senoner et al.   SURFACE AND INTERFACE ANALYSIS

SIMS imaging of the nanoworld: applications in science and technology

(2012) Mathias Senoner et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Quantitative nanoscale surface voltage measurement on organic semiconductor blends

(2012) Alexandre Cuenat et al.   NANOTECHNOLOGY

Ultra high spatial resolution SIMS with cluster ions - approaching the physical limits

(2012) Felix Kollmer et al.   SURFACE AND INTERFACE ANALYSIS

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument withIn SituAFM

(2011) James A. Whitby et al.   Advances in Materials Science and Engineering

Imaging surface analysis: Lateral resolution and its relation to contrast and noise

(2010) Mathias Senoner et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy

(2009) A Bailly et al.   JOURNAL OF PHYSICS-CONDENSED MATTER

Deconvolution of Kelvin probe force microscopy measurements—methodology and application

(2009) T Machleidt et al.   MEASUREMENT SCIENCE and TECHNOLOGY

Characterization of nanoparticles by scanning electron microscopy in transmission mode

(2009) E Buhr et al.   MEASUREMENT SCIENCE and TECHNOLOGY

Advanced thin film technology for ultrahigh resolution X-ray microscopy

(2009) Joan Vila-Comamala et al.   ULTRAMICROSCOPY