Journal
ANALYTICAL AND BIOANALYTICAL CHEMISTRY
Volume 405, Issue 5, Pages 1479-1495Publisher
SPRINGER HEIDELBERG
DOI: 10.1007/s00216-012-6394-8
Keywords
XPS; Self-assembly; Monolayer; Nanoarchitecture; Sensing
Funding
- FIRB project ITALNANO-NET [RBPR05JH2P]
- MIUR: P.R.I.N.
- University of Catania
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Molecular monolayers and similar nanoarchitectures are indicative of the promising future of nanotechnology. Therefore, many scientists recently devoted their efforts to the synthesis, characterization, and properties of mono- and multilayer-based systems. In this context, X-ray photoelectron spectroscopy is an important technique for the in-depth chemical and structural characterization of nanoscopic systems. In fact, it is a surface technique suitable for probing thicknesses of the same order of the photoelectron inelastic mean free paths (a few tens of Ayenngstroms) and allows one to immediately obtain qualitative and quantitative data, film thickness, surface coverage, molecule footprint, oxidation states, and presence of functional groups. Nevertheless, other techniques are important in obtaining a complete spectroscopic characterization of the investigated systems. Therefore, in the present review we report on X-ray photoelectron spectroscopy of self-assembled molecular mono- and multilayer materials including some examples on which other characterization techniques produced important results.
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