An integrated solid-state solution for secondary electron detection

Title
An integrated solid-state solution for secondary electron detection
Authors
Keywords
Multi-pixel, CMOS, Photon detector, Secondary electron detection, Scanning electron microscope
Journal
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
Volume 79, Issue 2, Pages 395-411
Publisher
Springer Nature
Online
2013-11-23
DOI
10.1007/s10470-013-0234-4

Ask authors/readers for more resources

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started