Photo-Insensitive Amorphous Oxide Thin-Film Transistor Integrated with a Plasmonic Filter for Transparent Electronics

Improvement in Photo-Bias Stability of High-Mobility Indium Zinc Oxide Thin-Film Transistors by Oxygen High-Pressure Annealing

(2013) Se Yeob Park et al.   IEEE ELECTRON DEVICE LETTERS

Plasmonic Color Filter and its Fabrication for Large-Area Applications

(2013) Yun Seon Do et al.   Advanced Optical Materials

Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

(2012) E. Fortunato et al.   ADVANCED MATERIALS

Plasmonic Color Filters for CMOS Image Sensor Applications

(2012) Sozo Yokogawa et al.   NANO LETTERS

Gated three-terminal device architecture to eliminate persistent photoconductivity in oxide semiconductor photosensor arrays

(2012) Sanghun Jeon et al.   NATURE MATERIALS

Correlation of the change in transfer characteristics with the interfacial trap densities of amorphous In–Ga–Zn–O thin film transistors under light illumination

(2011) Jeong Hwan Kim et al.   APPLIED PHYSICS LETTERS

CMOS Photodetectors Integrated With Plasmonic Color Filters

(2011) Qin Chen et al.   IEEE PHOTONICS TECHNOLOGY LETTERS

Instability of an Amorphous Indium Gallium Zinc Oxide TFT under Bias and Light Illumination

(2011) Jae-Hong Jeon et al.   JOURNAL OF THE KOREAN PHYSICAL SOCIETY

O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors

(2010) Byungki Ryu et al.   APPLIED PHYSICS LETTERS

Photon-accelerated negative bias instability involving subgap states creation in amorphous In–Ga–Zn–O thin film transistor

(2010) Himchan Oh et al.   APPLIED PHYSICS LETTERS

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

(2010) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Influence of Illumination on the Negative-Bias Stability of Transparent Hafnium–Indium–Zinc Oxide Thin-Film Transistors

(2010) Joon Seok Park et al.   IEEE ELECTRON DEVICE LETTERS

Fast All-Transparent Integrated Circuits Based on Indium Gallium Zinc Oxide Thin-Film Transistors

(2010) A. Suresh et al.   IEEE ELECTRON DEVICE LETTERS

Material characteristics and applications of transparent amorphous oxide semiconductors

(2010) Toshio Kamiya et al.   NPG Asia Materials

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Transparent and Photo-stable ZnO Thin-film Transistors to Drive an Active Matrix Organic-Light- Emitting-Diode Display Panel

(2008) Sang-Hee K. Park et al.   ADVANCED MATERIALS

The positive bias temperature instability of n-channel metal-oxide-semiconductor field-effect transistors with ZrO2 gate dielectric

(2008) De-Cheng Hsu et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Microscopic theory of the extraordinary optical transmission

(2008) Haitao Liu et al.   NATURE

Efficiency and finite size effects in enhanced transmission through subwavelength apertures

(2008) F. Przybilla et al.   OPTICS EXPRESS