Assessing Antisite Defect and Impurity Concentrations in Bi2Te3Based Thin Films by High-Accuracy Chemical Analysis

Title
Assessing Antisite Defect and Impurity Concentrations in Bi2Te3Based Thin Films by High-Accuracy Chemical Analysis
Authors
Keywords
-
Journal
ADVANCED FUNCTIONAL MATERIALS
Volume 23, Issue 39, Pages 4969-4976
Publisher
Wiley
Online
2013-04-26
DOI
10.1002/adfm.201300606

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