External Noise Effects in Silicon MOS Inversion Layer

Published 2013 View Full Article

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Title
External Noise Effects in Silicon MOS Inversion Layer
Authors
Keywords
-
Journal
ACTA PHYSICA POLONICA B
Volume 44, Issue 5, Pages 1163
Publisher
Acta Physica Polonica B Editorial Office
Online
2013-06-19
DOI
10.5506/aphyspolb.44.1163

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