Journal
ACTA MATERIALIA
Volume 60, Issue 5, Pages 2091-2096Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2012.01.005
Keywords
Thermal stability; Thermal conductivity; Electrical resistivity; Optical reflectivity; TiAlN
Funding
- Austrian Science Fund (FWF-START) [Y371]
- Christian Doppler Gesellschaft within the framework of the Christian Doppler Laboratory for Application Oriented Coatings Development
- US Air Force Research Laboratory [FA8650-07-D-5800]
- Austrian Science Fund (FWF) [Y371] Funding Source: Austrian Science Fund (FWF)
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Monolithic single phase cubic (c) Ti1-xAlxN thin films are used in various industrial applications due to their high thermal stability, which beneficially effects lifetime and performance of cutting and milling tools, but also find increasing utilization in electronic and optical devices. The present study elucidates the temperature-driven evolution of heat conductivity, electrical resistivity and optical reflectance from room temperature up to 1400 degrees C and links them to structural and chemical changes in Ti1-xAlxN coatings. It is shown that various decomposition phenomena, involving recovery and spinodal decomposition (known to account for the age hardening phenomenon in c-Ti1-xAlxN), as well as the cubic to wurtzite phase transformation of spinodally formed AlN-enriched domains, effectively increase the thermal conductivity of the coatings from similar to 3.8 W m(-1) K-1 by a factor of three, while the electrical resistivity is reduced by one order of magnitude. A change in the coating color from metallic grey after deposition to reddish-golden after annealing to 1400 degrees C is related to the film structure and discussed in terms of film reflectivity. (C) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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