Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches

Published 2011 View Full Article

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Title
Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches
Authors
Keywords
-
Journal
ACTA MATERIALIA
Volume 59, Issue 20, Pages 7508-7520
Publisher
Elsevier BV
Online
2011-10-18
DOI
10.1016/j.actamat.2011.08.034

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