Label-Free Measurement of Cell–Electrode Cleft Gap Distance with High Spatial Resolution Surface Plasmon Microscopy

Published 2014 View Full Article

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Title
Label-Free Measurement of Cell–Electrode Cleft Gap Distance with High Spatial Resolution Surface Plasmon Microscopy
Authors
Keywords
-
Journal
ACS Nano
Volume 8, Issue 12, Pages 12612-12619
Publisher
American Chemical Society (ACS)
Online
2014-11-26
DOI
10.1021/nn505521e

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